Metrology focus enhancer

Metrology focus enhancer

May 7, 2019

Mitutoyo America Corporation

TAGLENS series products for inspection applications, such as non-contact ultra-high-speed inspection systems, reduces the need for mechanical focusing modules. The patented technology powering the TAGLENS series of products was invented at Princeton University by a team led by Professor Craig B. Arnold. It was later developed and commercialized by TAG Optics Inc., a company co-founded by Arnold and Princeton alumnus Christian Theriault. In 2016, Mitutoyo acquired a controlling interest in TAG Optics Inc. with the intention to further develop the technology.

Mitutoyo’s TAGLENS-T1 can be used in demanding industrial and harsh environment while maintaining nano-second level resolution because of its controller. An optional SDK enables users to seamlessly integrate the TAGLENS-T1 and the many benefits of the TAG technology into their own system.

The TAGLENS-T1 can change focus in 70kHz enabling productivity and cost improvement across a range of quality assurance processes. Its focusing speed can increase the depth-of-field of any optical system, and it’s capable of withstanding large amount of vibrations and shock or being mounted on robotic arms while maintaining optical performance.

As part of the TAGLENS product launch is the Mitutoyo VMU-T1: the first commercial system to incorporate the TAG technology. The combination embodied in the VMU-T1 delivers a powerful inspection tool which, when using Mitutoyo’s M Plan Apo Series of objectives, generates imaging depth-of-field capabilities up to 20x greater than similar systems, reducing the need for mechanical Z-motion, in turn reducing the time needed to inspect parts with complex geometry.